R.J. Von Gutfeld, D.R. Vigliotti, et al.
Applied Physics Letters
Paper
Penetration effect at sharp edges in the scanning electron microscope
Abstract
No abstract available.
Related
N.G. Ainslie, F.M. D'Heurle, et al.
Applied Physics Letters
L. Gignac, M. Kawasaki, et al.
Journal of Applied Physics
J.P. Jakubovics, O.C. Wells
Journal of Magnetism and Magnetic Materials