Applied Spectroscopy Reviews

Paper

05 Dec 2006

Plasma Sources in Analytical Mass Spectrometry

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Abstract

No abstract available.

Paper

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Ion-induced volatilization (IIV): A method for quantitative measurement of the amounts of perfluoropolyether lubricant on a particulate disk surface and in the media porosity

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The etching of silicon with XeF₂ vapor

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Glow-discharge mass spectrometry - Technique for determining elemental composition profiles in solids

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