Conference paperHigh performance and highly uniform gate-all-around silicon nanowire MOSFETs with wire size dependent scalingS. Bangsaruntip, G.M. Cohen, et al.IEDM 2009
Conference paperMeasurements of carrier transport in MOSFETs with bottom-up nanowire channel as a function of the nanowire diameterG.M. Cohen, S. Bangsaruntip, et al.DRC 2008
Conference paperImpact of Cu microstructure on electromigration reliabilityC.-K. Hu, L. Gignac, et al.IITC 2007
Conference paperLow voltage, scalable nanocrystal FLASH memory fabricated by templated self assemblyK.W. Guarini, C.T. Black, et al.IEDM 2003