Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
A phenomenological explanation of Raman scattering in amorphous Si, Ge and III-V semiconductors is given, using Si as an example. Several applications of Raman scattering to the study of amorphous materials are discussed. © 1972.
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
Hiroshi Ito, Reinhold Schwalm
JES
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
J.K. Gimzewski, T.A. Jung, et al.
Surface Science