R.M. Feenstra, Joseph A. Stroscio
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
The structure of steps on cleaved silicon (111) surfaces is studied by scanning tunneling microscopy. Predominantly [21»1»] oriented steps are observed. Ordered regions of individual steps have unit periodicity along the step edge. A -bonded reconstruction of the step edge is deduced from the images. © 1987 The American Physical Society.
R.M. Feenstra, Joseph A. Stroscio
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
R.M. Feenstra, Joseph A. Stroscio
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
C.K. Shih, R.M. Feenstra, et al.
Physical Review B
R.M. Feenstra, M.A. Lutz, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures