R.M. Feenstra, W.A. Thompson, et al.
JVSTA
The structure of steps on cleaved silicon (111) surfaces is studied by scanning tunneling microscopy. Predominantly [21»1»] oriented steps are observed. Ordered regions of individual steps have unit periodicity along the step edge. A -bonded reconstruction of the step edge is deduced from the images. © 1987 The American Physical Society.
R.M. Feenstra, W.A. Thompson, et al.
JVSTA
M. Johnson, O. Albrektsen, et al.
Applied Physics Letters
Joseph A. Stroscio, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Joseph A. Stroscio, D.M. Newns, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films