R.M. Feenstra, J. Woodall, et al.
Physical Review Letters
The structure of steps on cleaved silicon (111) surfaces is studied by scanning tunneling microscopy. Predominantly [21»1»] oriented steps are observed. Ordered regions of individual steps have unit periodicity along the step edge. A -bonded reconstruction of the step edge is deduced from the images. © 1987 The American Physical Society.
R.M. Feenstra, J. Woodall, et al.
Physical Review Letters
Joseph A. Stroscio, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Joseph A. Stroscio, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
R.M. Feenstra, G. Meyer, et al.
Physical Review B - CMMP