M.W. Wang, D.A. Collins, et al.
Applied Physics Letters
The structure of steps on cleaved silicon (111) surfaces is studied by scanning tunneling microscopy. Predominantly [21»1»] oriented steps are observed. Ordered regions of individual steps have unit periodicity along the step edge. A -bonded reconstruction of the step edge is deduced from the images. © 1987 The American Physical Society.
M.W. Wang, D.A. Collins, et al.
Applied Physics Letters
R.M. Feenstra
Physical Review B
O. Auciello, Phaedon Avouris, et al.
MRS Bulletin
Joseph A. Stroscio, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films