R. Ghez, M.B. Small
JES
The graphitelike model recently proposed by Jones and Holland for the structure of a laser-stabilized Si{111}1×1 surface is subjected to a new low-energy electron-diffraction (LEED) intensity analysis and compared to the relaxed-bulk model produced by earlier LEED analyses. Three different reliability factors applied to the normal-incidence data, and visual evaluation of non-normal-incidence data, discriminate unambiguously in favor of the relaxed-bulk model against the graphitelike model. © 1986 The American Physical Society.
R. Ghez, M.B. Small
JES
Eloisa Bentivegna
Big Data 2022
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011