H.D. Dulman, R.H. Pantell, et al.
Physical Review B
The graphitelike model recently proposed by Jones and Holland for the structure of a laser-stabilized Si{111}1×1 surface is subjected to a new low-energy electron-diffraction (LEED) intensity analysis and compared to the relaxed-bulk model produced by earlier LEED analyses. Three different reliability factors applied to the normal-incidence data, and visual evaluation of non-normal-incidence data, discriminate unambiguously in favor of the relaxed-bulk model against the graphitelike model. © 1986 The American Physical Society.
H.D. Dulman, R.H. Pantell, et al.
Physical Review B
David B. Mitzi
Journal of Materials Chemistry
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films