O.C. Wells
Scanning
Thin films of lead and aluminum on substrates of lower thermal expansion coefficient were examined using a hot stage in a scanning electron microscope. Hillocks were seen to grow as the temperature was increased and then to shrink as the temperature slowly fell. This effect is thought to be caused by a change from compressive into tensile stress in the film. © 1969 The American Institute of Physics.
O.C. Wells
Scanning
N.J. Chou, S.K. Lahiri, et al.
The Journal of Chemical Physics
O.C. Wells, Maurice McGlashen-Powell, et al.
Scanning
O.C. Wells, C.G. Bremer
Journal of Physics E: Scientific Instruments