Conference paper
A small test generator for large designs
Sandip Kundu, Leendert M. Huisman, et al.
IEEE ITC 1992
Paper
Self-checking comparator with one periodic output
Abstract
In this paper we propose a new self-checking comparator with one periodic output. The comparator can be used as a two-rail checker or as an equality checker. Two different input patterns are sufficient to detect all the faults considered. ©1996 IEEE.
Related
Sandip Kundu, Sudhakar M. Reddy, et al.
ICCAD 1987
Sandip Kundu
IEICE Transactions on Information and Systems
Conference paper
Symbolic implication in test generation
Sandip Kundu, I. Nair, et al.
European Conference on Design Automation 1992