T.W. Hickmott, P. Solomon, et al.
Physical Review Letters
We report on an annealing process which controls the stress in SOS. By laser power inputs of various durations, we regrow the Si on a compressed sapphire surface. The room temperature stress in Si correlates with the time scale of the annealing process. The effect can be understood in terms of thermal stress at the sapphire surface.
T.W. Hickmott, P. Solomon, et al.
Physical Review Letters
R.B. Dunford, E.E. Mitchell, et al.
Journal of Physics Condensed Matter
A. Deutsch, H. Smith, et al.
IEEE Topical Meeting EPEPS 1998
D.A. Syphers, F. Fang, et al.
Surface Science