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SPIE Advances in Semiconductors and Superconductors 1990
Using high-resolution transmission electron microscopy the observation of two different metastable structures at a Σ = 5/[001]53·1° (210) symmetrical tilt boundary are reported upon. A structural unit approach is used to describe the differences between these structures. The results are consistent with computer simulation studies where a small difference in minimum energy states was previously reported. © 1991 Taylor & Francis Group, LLC.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
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arXiv
Surendra B. Anantharaman, Joachim Kohlbrecher, et al.
MRS Fall Meeting 2020