Weiqiang Xie, Thilo Stöferle, et al.
CLEO 2016
We reveal inhomogeneous structural phase transformation in photo-excited VO2 thin films by time-resolved x-ray diffraction microscopy. The in-plane plane phase progression is a result of displacive lattice transformation rather than driven by thermal transport.
Weiqiang Xie, Thilo Stöferle, et al.
CLEO 2016
Eric J. Zhang, L. Tombez, et al.
CLEO 2016
T.N. Huynh, Nicolas Dupuis, et al.
CLEO 2016
A.X. Gray, Matthias C. Hoffmann, et al.
Physical Review B