Mesoscopic structural phase progression in photo-excited VO2 revealed by time-resolved x-ray diffraction microscopy
- Y. Zhu
- Zhonghou Cai
- et al.
- 2016
- Scientific Reports
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13 results for Zhonghou Cai
Structural phase progression in photo-excited VO2
- Y. Zhu
- Zhonghou Cai
- et al.
- 2016
- CLEO 2016
A next-generation in-situ nanoprobe beamline for the advanced photon source
- Jörg Maser
- Barry Lai
- et al.
- 2013
- SPIE Optical Engineering + Applications 2013
Submicron mapping of strain distributions induced by three-dimensional through-silicon via features
- Conal E. Murray
- T. Graves-Abe
- et al.
- 2013
- Applied Physics Letters
Probing strain at the nanoscale with X-ray diffraction in microelectronic materials induced by stressor elements
- Conal E. Murray
- S. Polvino
- et al.
- 2013
- Thin Solid Films
Nanoscale strain characterization in microelectronic materials using X-ray diffraction
- Conal E. Murray
- Andrew Ying
- et al.
- 2012
- Powder Diffraction
Strain measured in a silicon-on-insulator, complementary metal-oxide-semiconductor device channel induced by embedded silicon-carbon source/drain regions
- Conal E. Murray
- Z. Ren
- et al.
- 2009
- Applied Physics Letters
Submicron mapping of silicon-on-insulator strain distributions induced by stressed liner structures
- Conal E. Murray
- K.L. Saenger
- et al.
- 2008
- Journal of Applied Physics
Real-space strain mapping of SOI features using microbeam X-ray diffraction
- Conal E. Murray
- S. Polvino
- et al.
- 2008
- Powder Diffraction
Synchrotron microbeam x-ray radiation damage in semiconductor layers
- Sean M. Polvino
- Conal E. Murray
- et al.
- 2008
- Applied Physics Letters