PaperVoltage measurement in the scanning electron microscopeO.C. Wells, C.G. BremerJournal of Physics E: Scientific Instruments
PaperEnhancement of type‐2 magnetic contrast in the bse image in the SEM by a lock‐in techniqueO.C. Wells, R.J. SavoyScanning
PaperAutomatic Positioning of Device Electrodes Using the Scanning Electron MicroscopeO.C. Wells, T.E. Everhart, et al.IEEE T-ED
PaperMethod for examining solid specimens with improved resolution in the scanning electron microscope (SEM)O.C. Wells, A.N. Broers, et al.Applied Physics Letters
