T.G. Van Kessel, H.K. Wickramasinghe
Optics Letters
Joule displacement microscopy, where the periodic expansion caused by Joule heating in a thin-film track carrying ac current is mapped using a focused probe, has recently been described. In this letter, we demonstrate the application of this technique to the study of current distribution within a bipolar inverting gate.
T.G. Van Kessel, H.K. Wickramasinghe
Optics Letters
Y. Martin, H.K. Wickramasinghe
Applied Physics Letters
H.K. Wickramasinghe
Proceedings of SPIE 1989
Y. Martin, D. Rugar, et al.
Applied Physics Letters