Summary Abstract: In situ surface and interface magnetic characterization of thin films

Robert W. Keyes

Physical Review B

Hiroshi Ito, Reinhold Schwalm

JES

P. Martensson, R.M. Feenstra

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

A. Ney, R. Rajaram, et al.

Journal of Magnetism and Magnetic Materials