S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Changes in surface structure for thin epitaxial Si layers (Si*) grown on Si(100) below 500°C using alternating exposures to Si precursors are presented. Two different methods for growing Si* are compared, which involve a self-limiting exposure to Si2Cl6 followed by removal of the Cl layer with either Si2H6 or atomic hydrogen. Scattering and recoiling spectroscopy is used to depth profile a N marker layer as Si* is grown using Si2Cl6 and Si2H6 at TS=465°C. The decrease in the N marker intensity proves that a Si* film is grown, and reflection high-energy electron diffraction (RHEED) patterns show that the Si* is epitaxial. RHEED patterns from Si* grown using alternating exposures of Si2Cl6 and atomic hydrogen are nearly identical to clean Si(100), again indicating epitaxial growth. Both methods suppress formation of three-dimensional islands, which are observed for Si growth from Si 2H6 below TS=600°C.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
G. Bonilla, T.M. Shaw, et al.
IRPS 2012
D.D. Koleske, S. Gates, et al.
The Journal of Chemical Physics
A. Grill, D. Edelstein, et al.
IITC 2004