Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
Paper
The structure of overlayers. I. Se on Ag {001}
Abstract
No abstract available.
Related
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
J.C. Marinace
JES