M. Hargrove, S.W. Crowder, et al.
IEDM 1998
Thin film confinement issues in poly(hydroxy styrene) (PHS) were addressed using both specular x-ray reflectivity (SXR) and incoherent neutron scattering (INS). SXR measured the uniformity and thickness of PHS films supported on various substrates as a function of temperature. On the other hand, INS directly probed the dynamics of a hydrogeneous polymer by measuring the amplitude of the average mean-square atomic displacements.
M. Hargrove, S.W. Crowder, et al.
IEDM 1998
Imran Nasim, Melanie Weber
SCML 2024
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992