Conference paper
Fault simulation on message passing
Leendert M. Huisman, Raja Daoud, et al.
DMCC 1990
Paper
TRIM: Testability Range by Ignoring the Memory
Abstract
The testability by random test patterns of faults in the logic surrounding embedded RAM's is studied. Upper and lower bounds on the probability that a fault is caught are obtained by analyzing a modified, purely combinational circuit without the RAM. This analysis can be done with standard testability analysis techniques. The analysis is applied to an embedded two-port RAM. © 1988 IEEE
Related
Conference paper
Modeling parallel computers as memory hierarchies
Bowen Alpern, Larry Carter, et al.
PMMP 1993
Z. Barzilai, D. Beece, et al.
DAC 1986
Conference paper
TRIM: TESTABILITY RANGE BY IGNORING THE MEMORY.
Larry Carter, Leendert M. Huisman, et al.
IEEE ITC 1985