Conference paper
Fault simulation on message passing
Leendert M. Huisman, Raja Daoud, et al.
DMCC 1990
The testability by random test patterns of faults in the logic surrounding embedded RAM's is studied. Upper and lower bounds on the probability that a fault is caught are obtained by analyzing a modified, purely combinational circuit without the RAM. This analysis can be done with standard testability analysis techniques. The analysis is applied to an embedded two-port RAM. © 1988 IEEE
Leendert M. Huisman, Raja Daoud, et al.
DMCC 1990
Leendert M. Huisman
ICCD 1985
Bowen Alpern, Larry Carter, et al.
Algorithmica
Leendert M. Huisman
IBM J. Res. Dev