Bowen Alpern, Larry Carter, et al.
PMMP 1995
The testability by random test patterns of faults in the logic surrounding embedded RAM's is studied. Upper and lower bounds on the probability that a fault is caught are obtained by analyzing a modified, purely combinational circuit without the RAM. This analysis can be done with standard testability analysis techniques. The analysis is applied to an embedded two-port RAM. © 1988 IEEE
Bowen Alpern, Larry Carter, et al.
PMMP 1995
Z. Barzilai, D. Beece, et al.
DAC 1986
Bowen Alpern, Larry Carter, et al.
FOCS 1990
Bowen Alpern, Larry Carter, et al.
Algorithmica