Diagnosis and characterization of timing-related defects by time-dependent light emission
- D.R. Knebel
- P.N. Sanda
- et al.
- 1998
- IEEE ITC 1998
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14 results for Leendert M. Huisman
Yield fluctuations and defect models
- Leendert M. Huisman
- 1995
- Journal of Electronic Testing
Highly Reliable Symmetric Networks
- Leendert M. Huisman
- Sandip Kundu
- 1994
- IEEE TPDS
Symbolic implication in test generation
- Sandip Kundu
- I. Nair
- et al.
- 1992
- European Conference on Design Automation 1992
A small test generator for large designs
- Sandip Kundu
- Leendert M. Huisman
- et al.
- 1992
- IEEE ITC 1992
Fault simulation of logic designs on parallel processors with distributed memory
- Leendert M. Huisman
- Raja Daoud
- 1990
- IEEE ITC 1990
Fault simulation on message passing
- Leendert M. Huisman
- Raja Daoud
- et al.
- 1990
- DMCC 1990
Simulation of embedded memories by defective hashing
- Leendert M. Huisman
- 1990
- IBM J. Res. Dev
The reliability of approximate testabilty measures
- Leendert M. Huisman
- 1988
- IEEE Design and Test of Computers
TRIM: Testability Range by Ignoring the Memory
- Larry Carter
- Leendert M. Huisman
- et al.
- 1988
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems