Ellen J. Yoffa, David Adler
Physical Review B
We present a review of the principles of scanning tunneling microscopy and of its extensions by modulation techniques. Emphasis is placed on topographic studies of semiconductor surfaces with atomic resolution, finite voltage effects and surface state detection by tunneling spectroscopy. Results obtained for an ordered Au/Si(111) overlayer illustrate the versatility of this unique local probe of structural and electronic surface properties. © 1986.
Ellen J. Yoffa, David Adler
Physical Review B
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Robert W. Keyes
Physical Review B
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering