Conference paper
A statistical critical path monitor in 14nm CMOS
Bruce Fleischer, Christos Vezyrtzis, et al.
ICCD 2016
Paper
Verifying SRAM Designs
Abstract
No abstract available.
Related
Karthik Balakrishnan, Keith A. Jenkins, et al.
ISQED 2011
Shu Jen Han, Alberto Valdes Garcia, et al.
Nature Communications
Keith A. Jenkins, Karthik Balakrishnan, et al.
IEEE Electron Device Letters