Measurement of in-plane magnetization by force microscopy
- David W. Abraham
- C.C. Williams
- et al.
- 1988
- Applied Physics Letters
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18 results for C.C. Williams
Noise reduction technique for scanning tunneling microscopy
- David W. Abraham
- C.C. Williams
- et al.
- 1988
- Applied Physics Letters
Atomic force microscope-force mapping and profiling on a sub 100-Å scale
- Y. Martin
- C.C. Williams
- et al.
- 1987
- Journal of Applied Physics
Scanning thermal profiler
- C.C. Williams
- H.K. Wickramasinghe
- 1986
- Applied Physics Letters
Scanning thermal profiler
- C.C. Williams
- H.K. Wickramasinghe
- 1986
- Microelectronic Engineering
Optical ranging by wavelength multiplexed interferometry
- C.C. Williams
- H.K. Wickramasinghe
- 1986
- Journal of Applied Physics
High-Resolution Photothermal Laser Probe
- Clayton C. Williams
- 1985
- IEEE Transactions on Sonics and Ultrasonics
Two-dimensional modeling of an optical disk readout
- V.B. Jipson
- C.C. Williams
- 1983
- Applied Optics