Modeling of luminescence phase delay for nondestructive characterization of Si wafers
- D. Guidotti
- J.S. Batchelder
- et al.
- 1989
- Journal of Applied Physics
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3 results for A. Finkel
First-overtone response in modulated photoluminescence emission in silicon at room temperature
- D. Guidotti
- J.S. Batchelder
- et al.
- 1988
- Physical Review B
Nondestructive depth profiling of carrier lifetimes in full silicon wafers
- D. Guidotti
- J.S. Batchelder
- et al.
- 1986
- Applied Physics Letters