Spatial Charge Distribution in As-Deposited and UV-Illuminated Gate-Quality Nitrogen-Rich Silicon Nitride
- Jerzy Kanicki
- D. Jousse
- 1989
- IEEE Electron Device Letters
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8 results for D. Jousse
Electron spin resonance spectroscopy of defects in low temperature dielectric films
- D. Jousse
- Jerzy Kanicki
- et al.
- 1989
- Proceedings of SPIE 1989
Light-induced effects in hydrogenated amorphous nitrogen-rich silicon nitride films
- Jerzy Kanicki
- D. Jousse
- et al.
- 1989
- Journal of Non-Crystalline Solids
Observation of multiple silicon dangling bond configurations in silicon nitride
- D. Jousse
- Jerzy Kanicki
- et al.
- 1989
- Applied Physics Letters
Investigation of the light-induced effects in nitrogen-rich silicon nitride films
- D. Jousse
- Jerzy Kanicki
- 1989
- Applied Physics Letters
Electron spin resonance study of metal-nitride-silicon structures: Observation of Si dangling bonds with different configurations and trapping properties in silicon nitride
- D. Jousse
- Jerzy Kanicki
- et al.
- 1989
- Applied Surface Science
High conductivity polycrystalline silicon obtained by molecular beam deposition
- S.L. Delage
- S.-J. Jeng
- et al.
- 1988
- Applied Physics Letters
Electron-spin-resonance study of defects in plasma-enhanced chemical vapor deposited silicon nitride
- D. Jousse
- Jerzy Kanicki
- et al.
- 1988
- Applied Physics Letters