Optical measurement of internal logic patterns in a flip-chip mounted silicon SRAM integrated circuit
- H. Heinrich
- N. Pakdaman
- et al.
- 1992
- LEOS 1992
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5 results for L.M. Cropp
Backside optical detection of internal gate delays in flip-chip mounted silicon VLSI circuits
- H. Heinrich
- N. Pakdaman
- et al.
- 1990
- LEOS 1990
Picosecond backside optical detection of internal signals in flip-chip mounted silicon VLSI circuits
- H. Heinrich
- N. Pakdaman
- et al.
- 1992
- Microelectronic Engineering
The Frequency Behavior of InGaAs/AlInAs Metal - Semiconductor - Metal Photodetectors at Low Bias Voltages for Data Communication Applications
- J.H. Burroughes
- M.S. Milshtein
- et al.
- 1992
- IEEE Photonics Technology Letters
Backside Optical Measurements of Picosecond Internal Gate Delays in a Flip-Chip Packaged Silicon VLSI Circuit
- D.S. Kent
- L.M. Cropp
- 1991
- IEEE Photonics Technology Letters