E. Burstein
Ferroelectrics
We present picosecond backside optical measurements of currents and voltages, propagation delays, and glitches in flip-chip mounted silicon IC's. These signals are shown to compare well with prior circuit simulations, but they showed additional features not easily simulated. © 1992.
E. Burstein
Ferroelectrics
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
A. Gangulee, F.M. D'Heurle
Thin Solid Films
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery