Transistor-limited constant voltage stress of gate dielectrics
- B.P. Linder
- D.J. Frank
- et al.
- 2001
- VLSI Technology 2001
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96 results for Barry P. Linder
Calculating the error in long term oxide reliability estimates
- B.P. Linder
- J.H. Stathis
- et al.
- 2001
- IRPS 2001
Calculating the error in long term oxide reliability estimates
- B.P. Linder
- J.H. Stathis
- et al.
- 2001
- IRPS 2001
Modeling of energy distributions for plasma implantation
- Barry P. Linder
- Nathan W. Cheung
- 2001
- Surface and Coatings Technology
Breakdown measurements of ultra-thin SiO2 at low voltage
- J.H. Stathis
- A. Vayshenker
- et al.
- 2000
- VLSI Technology 2000
Gate oxide breakdown under Current Limited Constant Voltage Stress
- B.P. Linder
- J.H. Stathis
- et al.
- 2000
- Digest of Technical Papers-Symposium on VLSI Technology