Non-invasive timing analysis of IBM G6 microprocessor L1 cache using backside time-resolved hot electron luminescence
- S. Polonsky
- D.R. Knebel
- et al.
- 2000
- ISSCC 2000
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24 results for M. McManus
An advanced optical diagnostic technique of IBM z990 eServer microprocessor
- Peilin Song
- Franco Stellari
- et al.
- 2005
- IEEE ITC 2005
Dynamic latchup study using transmission line pulses and picosecond imaging circuit analysis
- Franco Stellari
- Alan J. Weger
- et al.
- 2004
- ESSDERC/ESSCIRC 2004
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- K. Chatty
- P.E. Cottrell
- et al.
- 2004
- IRPS 2004
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- K. Chatty
- P.E. Cottrell
- et al.
- 2004
- IRPS 2004
Optical and Electrical Testing of Latchup in I/O Interface Circuits
- Franco Stellari
- Peilin Song
- et al.
- 2003
- IEEE ITC 2003
Time-Resolved Optical Measurements from 0.13μm CMOS Technology Microprocessor using a Superconducting Single-Photon Detector
- Franco Stellari
- Peilin Song
- et al.
- 2003
- ISTFA 2003
Study of Critical Factors Determining Latchup Sensitivity of ICs using Emission Microscopy
- Franco Stellari
- Peilin Song
- et al.
- 2003
- ISTFA 2003
Latchup Analysis Using Emission Microscopy
- Franco Stellari
- Peilin Song
- et al.
- 2003
- Microelectronics Reliability
Characterization of light emission from SiGe heterojunction bipolar transistor for photon emission microscopy applications
- Stas Polonsky
- Andrei Talalaevskii
- et al.
- 2003
- IRPS 2003