Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latch up
- Alan Weger
- Steven Voldman
- et al.
- 2003
- IRPS 2003
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24 results for M. McManus
Characterization of light emission from SiGe heterojunction bipolar transistor for photon emission microscopy applications
- Stas Polonsky
- Andrei Talalaevskii
- et al.
- 2003
- IRPS 2003
Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup
- Alan Weger
- Steven Voldman
- et al.
- 2003
- IRPS 2003
Faster IC analysis with PICA spatial temporal photon correlation and CAD autochanneling
- R. Desplats
- A. Eral
- et al.
- 2003
- Microelectronics Reliability
Circuit voltage probe based on time-integrated measurements of optical emission from leakage current
- Franco Stellari
- Peilin Song
- et al.
- 2002
- ISTFA 2002
Picosecond Imaging Circuit Analysis of Leakage Currents in CMOS Circuits
- Stas Polonsky
- Alan Weger
- et al.
- 2002
- ISTFA 2002
Timing characterization of Multiple Timing Domains
- Alan J. Weger
- Moyra McManus
- et al.
- 2002
- ISTFA 2002
Optical diagnosis of excess IDDQ in low power CMOS circuits
- Franco Stellari
- Peilin Song
- et al.
- 2002
- Microelectronics Reliability
Timing high-speed microprocessor circuits using picosecond imaging circuit analysis
- S.E. Steen
- M. McManus
- et al.
- 2001
- SPIE Photonics West 2001
Picosecond Imaging Circuit Analysis of the IBM G6 Microprocessor Cache
- Moyra McManus
- Pia Sanda
- et al.
- 1999
- ISTFA 1999