Ring oscillator based test structure for NBTI analysis
- Mark B. Ketchen
- Manjul Bhushan
- et al.
- 2007
- ICMTS 2007
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32 results for Manjul Bhushan
An integrated CAD methodology for evaluating MOSFET and parasitic extraction models and variability
- K. Koushik Das
- Steven G. Walker
- et al.
- 2007
- Proceedings of the IEEE
Data analysis techniques for CMOS technology characterization and product impact assessment
- Anne Gattiker
- Manjul Bhushan
- et al.
- 2006
- IEEE ITC 2006
Ring oscillator based technique for measuring variability statistics
- Manjul Bhushan
- Mark B. Ketchen
- et al.
- 2006
- ICMTS 2006
Optimizing history effects in 65nm PD-SOI CMOS
- Q. Liang
- T. Kawamura
- et al.
- 2006
- IEEE International SOI Conference 2006
Product-representative "at speed" test structures for CMOS characterization
- Mark B. Ketchen
- Manjul Bhushan
- 2006
- IBM J. Res. Dev
Ring oscillators for CMOS process tuning and variability control
- Manjul Bhushan
- Anne Gattiker
- et al.
- 2006
- IEEE Trans Semicond Manuf
Circuit to measure high speed pulse I-V characteristics with only DC I/O's
- Mark B. Ketchen
- Manjul Bhushan
- et al.
- 2005
- IEEE International SOI Conference 2005
High speed test structures for in-line process monitoring and model calibration
- Mark Ketchen
- Manjul Bhushan
- et al.
- 2005
- ICMTS 2005
Switching delay variability in NMOS and PMOS PDSOI passgate circuits
- Mark Ketchen
- Manjul Bhushan
- et al.
- 2005
- VLSI Technology 2005