Ring oscillator based technique for measuring variability statistics
- Manjul Bhushan
- Mark B. Ketchen
- et al.
- 2006
- ICMTS 2006
Publications
Date
Featured collections
Popular topics
32 results for Manjul Bhushan
Optimizing history effects in 65nm PD-SOI CMOS
- Q. Liang
- T. Kawamura
- et al.
- 2006
- IEEE International SOI Conference 2006
Circuit to measure high speed pulse I-V characteristics with only DC I/O's
- Mark B. Ketchen
- Manjul Bhushan
- et al.
- 2005
- IEEE International SOI Conference 2005
High speed test structures for in-line process monitoring and model calibration
- Mark Ketchen
- Manjul Bhushan
- et al.
- 2005
- ICMTS 2005
Switching delay variability in NMOS and PMOS PDSOI passgate circuits
- Mark Ketchen
- Manjul Bhushan
- et al.
- 2005
- VLSI Technology 2005
Photon emission microscopy of inter/intra chip device performance variations
- S. Polonsky
- M. Bhushan
- et al.
- 2005
- ESREF 2005
Technique for rapid, in-line characterization of switching history in partially depleted SOI technologies
- Dale J. Pearson
- Mark B. Ketchen
- et al.
- 2004
- IEEE International SOI Conference 2004
Body voltage and history effect sensitivity to key device parameters in 90nm PD-SOI
- S. Kawanaka
- M.B. Ketchen
- et al.
- 2004
- IEEE International SOI Conference 2004
Anomalous History Behavior in Stacked PD SOI Gates
- Mark B. Ketchen
- Manjul Bhushan
- 2003
- IEEE International SOI Conference 2003
Ultra-high-speed rapid single-flux-quantum digital circuits using a planarized-niobium-trilayer Josephson junction technology
- P.I. Bunyk
- V.K. Semenov
- et al.
- 1994
- DRC 1994