Impact of NBTI induced statistical variation to SRAM cell stability
- Giuseppe La Rosa
- Wee Loon Ng
- et al.
- 2006
- IRPS 2006
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8 results for Stewart Rauch Iii
NBTI-Channel Hot Carrier effects in pMOSFETs in advanced CMOS technologies
- G. La Rosa
- F. Guarin
- et al.
- 1997
- IRPS 1997
High-performance 0.08 μm CMOS
- L. Su
- S. Subbanna
- et al.
- 1996
- VLSI Technology 1996
300-mm Monolithic Silicon Photonics Foundry Technology
- Ken Giewont
- Karen Nummy
- et al.
- 2019
- IEEE JSTQE
Ultra-low emissivity alpha-particle detection
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2012
- IEEE TNS
Single-event upsets and multiple-bit upsets on a 45 nm SOI SRAM
- David F. Heidel
- Paul W. Marshall
- et al.
- 2009
- IEEE TNS
The energy-driven paradigm of NMOSFET hot-carrier effects
- Stewart E. Rauch Iii
- Giuseppe La Rosa
- 2005
- IEEE T-DMR
The statistics of NBTI-induced V T and β mismatch shifts in pMOSFETs
- Stewart E. Rauch III
- 2002
- IEEE T-DMR