Accurate inference with inaccurate RRAM devices: Statistical data, model transfer, and on-line adaptation
- Gouranga Charan
- Jubin Hazra
- et al.
- 2020
- DAC 2020
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15 results for Yu Cao
Variability analysis under layout pattern-dependent rapid-thermal annealing process
- Yun Ye
- Frank Liu
- et al.
- 2009
- DAC 2009
Digital-Assisted Analog In-Memory Computing with RRAM Devices
- Zhenyu Wang
- Pragnya Sudershan Nalla
- et al.
- 2023
- VLSI-TSA 2023
IMC Architecture for Robust DNN Acceleration
- Gokul Krishnan
- Zhenyu Wang
- et al.
- 2022
- ICSICT 2022
Design Limits of In-Memory Computing: Beyond the Crossbar
- Gokul Krishnan
- Jubin Hazra
- et al.
- 2021
- EDTM 2021
Robust RRAM-based In-Memory Computing in Light of Model Stability
- Gokul Krishnan
- Jingbo Sun
- et al.
- 2021
- IRPS 2021
Compact modeling of stress effects in scaled CMOS
- Chi-Chao Wang
- Wei Zhao
- et al.
- 2009
- SISPAD 2009
Modeling of layout-dependent stress effect in CMOS design
- Chi-Chao Wang
- Wei Zhao
- et al.
- 2009
- ICCAD 2009
Modeling and simulation of transistor performance shift under pattern-dependent RTA process
- Yun Ye
- Frank Liu
- et al.
- 2009
- SPIE Advanced Lithography 2009
Fast statistical circuit analysis with finite-point based transistor model
- Min Chen
- Wei Zhao
- et al.
- 2007
- DATE 2007