Endurance Evaluation on OTS-PCM Device using Constant Current Stress SchemeW. ChienLynne Gignacet al.2022IRPS 2022
Device Study on OTS-PCM for Persistent Memory Application : IBM/Macronix Phase Change Memory Joint ProjectW. ChienLynne Gignacet al.2022EDTM 2022
A no-verification Multi-Level-Cell (MLC) operation in Cross-Point OTS-PCMNanbo GongW. Chienet al.2020VLSI Technology 2020
Si Incorporation Into AsSeGe Chalcogenides for High Thermal Stability, High Endurance and Extremely Low Vth Drift 3D Stackable Cross-point MemoryHuai-Yu ChengI. Kuoet al.2020VLSI Technology 2020
Comprehensive Scaling Study on 3D Cross-Point PCM toward 1Znm Node for SCM ApplicationsW. ChienH. Hoet al.2019VLSI Technology 2019