Ultralow nanoscale wear through atom-by-atom attrition in silicon-containing diamond-like carbon
- Harish Bhaskaran
- Bernd Gotsmann
- et al.
- 2010
- Nature Nanotechnology
Publications
246 results for Abu Sebastian
High-throughput intermittent-contact scanning probe microscopy
- Deepak R. Sahoo
- Walter Häberle
- et al.
- 2010
- Nanotechnology
Estimation of amorphous fraction in multilevel phase-change memory cells
- 2010
- Solid-State Electronics
Feedback enhanced thermo-electric topography sensing
- A. Sebastian
- D. Wiesmann
- et al.
- 2009
- TRANSDUCERS 2009
Multiscale thermoelectric imaging for fast metrology and manipulation
- Rachel J. Cannara
- Abu Sebastian
- et al.
- 2009
- NANO 2009
Estimation of amorphous fraction in multilevel phase change memory cells
- 2009
- ESSDERC 2009
Magnetoresistive sensor based scanning probe microscopy
- D.R. Sahoo
- A. Sebastian
- et al.
- 2009
- NANO 2009
Novel scanning probe concepts for nanoscale electrical characterization
- Abu Sebastian
- Harish Bhaskaran
- et al.
- 2009
- NANO 2009
High-speed intermittent-contact mode scanning probe microscopy using cantilevers with integrated electrostatic actuator and thermoelectric sensor
- D.R. Sahoo
- W. Häberle
- et al.
- 2009
- ACC 2009
Nanoscale phase transformation in Ge2 Sb2 Te 5 using encapsulated scanning probes and retraction force microscopy
- Harish Bhaskaran
- Abu Sebastian
- et al.
- 2009
- Review of Scientific Instruments