Evaluation of high‐resolution electron microscopy as a method for studying Y‐Ba‐Cu‐O superconductors
- William Krakow
- Thomas M. Shaw
- 2005
- Journal of Electron Microscopy Technique
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148 results for Thomas M. Shaw
Environmental effects on cracking and delamination of dielectric films
- Michael W. Lane
- Xia Hu Liu
- et al.
- 2004
- IEEE T-DMR
The effect of current density, stripe length, stripe width, and temperature on resistance saturation during electromigration testing
- R. Filippi
- R.A. Wachnik
- et al.
- 2002
- Journal of Applied Physics
Hydrogen induced tunnel emission in Pt/(BaxSr1-x)Ti1+yO3+z/Pt thin film capacitors
- J.D. Baniecki
- R.B. Laibowitz
- et al.
- 2001
- Journal of Applied Physics
Properties of ferroelectric films at small dimensions
- T.M. Shaw
- S. Trolier-McKinstry
- et al.
- 2000
- Annual Review of Materials Science
The effect of stress on the dielectric properties of barium strontium titanate thin films
- T.M. Shaw
- Z. Suo
- et al.
- 1999
- Applied Physics Letters
(Ba,Sr)TiO3 dielectrics for future stacked-capacitor DRAM
- D.E. Kotecki
- J.D. Baniecki
- et al.
- 1999
- IBM J. Res. Dev
Fabrication of multilayer ferroelectric films
- Deborah A. Neumayer
- Peter R. Duncombe
- et al.
- 1999
- Integrated Ferroelectrics
Effects of annealing conditions on charge loss mechanisms in MOCVD Ba0·7Sr0·3TiO3 thin film capacitors
- J.D. Baniecki
- R.B. Laibowitz
- et al.
- 1999
- Journal of the European Ceramic Society
Dielectric relaxation of Ba0.7Sr0.3TiO3 thin films from 1 mHz to 20 GHz
- J.D. Baniecki
- R.B. Laibowitz
- et al.
- 1998
- Applied Physics Letters