SRAM stability characterization using tunable ring oscillators in 45nm CMOS
- Jason Tsai
- Seng Oon Toh
- et al.
- 2010
- ISSCC 2010
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8 results for Borivoje Nikolíc
Fixed- and variable-length ring oscillators for variability characterization in 45nm CMOS
- Ji-Hoon Park
- Liang-Teck Pang
- et al.
- 2009
- CICC 2009
Parameter-specific electronic measurement and analysis of sources of variation using ring oscillators
- Lynn T.-N. Wang
- Liang-Teck Panga
- et al.
- 2009
- SPIE Advanced Lithography 2009
A 225 μm2 probe single-point calibration digital temperature sensor using body-bias adjustment in 28 nm FD-SOI CMOS
- Martin Cochet
- Ben Keller
- et al.
- 2018
- IEEE SSC-L
Technology variability from a design perspective
- Borivoje Nikolić
- Ji-Hoon Park
- et al.
- 2011
- IEEE TCAS-I
Large-scale SRAM variability characterization in 45 nm CMOS
- Zheng Guo
- Andrew Carlson
- et al.
- 2009
- IEEE Journal of Solid-State Circuits
Measurement and analysis of variability in 45 nm strained-Si CMOS technology
- Liang-Teck Pang
- Kun Qian
- et al.
- 2009
- IEEE Journal of Solid-State Circuits
Measurements and analysis of process variability in 90 nm CMOS
- Liang-Teck Pang
- Borivoje Nikolić
- 2009
- IEEE Journal of Solid-State Circuits