Sputtering behavior and evolution of depth resolution upon low energy ion irradiation of GaAs
- Marinus Hopstaken
- Michael Gordon
- et al.
- 2010
- Journal of Vacuum Science and Technology B
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48 results for Michael S. Gordon
Flip-flop upsets from single-event-transients in 65 nm clock circuits
- Larry Wissel
- David F. Heidel
- et al.
- 2009
- IEEE TNS
An evaluation of an ultralow background alpha-particle detector
- Michael S. Gordon
- David F. Heidel
- et al.
- 2009
- IEEE TNS
Alpha-particle, carbon-ion and proton- induced flip-flop single-event-upsets in 65 nm bulk technology
- Larry Wissel
- Ethan H. Cannon
- et al.
- 2008
- IEEE TNS
Effects of film reoxidation on the growth and material properties of ultrathin dielectrics grown by rapid thermal nitridation in ammonia
- C. D'Emic
- J.S. Newbury
- et al.
- 2008
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Alpha-particle-induced upsets in advanced CMOS circuits and technology
- David F. Heidel
- Kenneth P. Rodbell
- et al.
- 2008
- IBM J. Res. Dev
New simulation methodology for effects of radiation in semiconductor chip structures
- Henry H.K. Tang
- Conal E. Murray
- et al.
- 2008
- IBM J. Res. Dev
Single-event-upset and alpha-particle emission rate measurement techniques
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2008
- IBM J. Res. Dev
Low-energy proton-induced single-event-upsets in 65 nm node, silicon-on-insulator, latches and memory cells
- Kenneth P. Rodbell
- David F. Heidel
- et al.
- 2007
- IEEE TNS
Importance of BEOL modeling in single event effect analysis
- Henry H. K. Tang
- Conal E. Murray
- et al.
- 2007
- IEEE TNS