Kenneth P. Rodbell, David F. Heidel, et al.
IEEE TNS
Experimental data are presented showing that low energy (< 2 MeV) proton irradiation can upset exploratory 65 nm node, Silicon-On-Insulator circuits. Alpha particle SER data, modeling and simulation results provide a plausible mechanism. This work suggests that track structures need to be understood and effectively modeled, especially for small, modern devices. © 2007 IEEE.
Kenneth P. Rodbell, David F. Heidel, et al.
IEEE TNS
James R. Schwank, Marty R. Shaneyfelt, et al.
IEEE TNS
Jonathan A. Pellish, Michael A. Xapsos, et al.
RADECS 2009
Cyril Cabral Jr., Benjamin Fletcher, et al.
ADMETA 2010