Latch design techniques for mitigating single event upsets in 65 nm SOI device technology
- A.J. KleinOsowski
- Ethan H. Cannon
- et al.
- 2007
- IEEE TNS
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48 results for Michael S. Gordon
Alpha particle mitigation strategies to reduce chip soft error upsets
- C. Cabral
- K.P. Rodbell
- et al.
- 2007
- Journal of Applied Physics
Single-event-upset critical charge measurements and modeling of 65 nm silicon-on-insulator latches and memory cells
- David F. Heidel
- Kenneth P. Rodbell
- et al.
- 2006
- IEEE TNS
Oxygen transport and reaction mechanisms in rhenium gate contacts on hafnium oxide films on Si
- R.P. Pezzi
- M. Copel
- et al.
- 2006
- Applied Physics Letters
Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground
- M. Gordon
- P. Goldhagen
- et al.
- 2004
- IEEE TNS
PREVAIL-EPL alpha tool: Early results
- S.D. Golladay
- H.C. Pfeiffer
- et al.
- 2001
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Projection reduction exposure with variable axis immersion lenses: Next generation lithography
- H.C. Pfeiffer
- R.S. Dhaliwal
- et al.
- 1999
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
PREVAIL: Operation of the electron optics proof-of-concept system
- M. Gordon
- J.E. Lieberman
- et al.
- 1999
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures