A modified voigt method for calculation of the elastic constants of ensembles selected by diffraction methods
- Conal E. Murray
- I.C. Noyan
- 1999
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
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66 results for I.C. Noyan
A cost-effective method for minimizing the sphere-of-confusion error of x-ray microdiffractometers
- I.C. Noyan
- S. Kaldor
- et al.
- 1999
- Review of Scientific Instruments
Mechanisms for microstructure evolution in electroplated copper thin films near room temperature
- J.M.E. Harper
- C. Cabral Jr.
- et al.
- 1999
- Journal of Applied Physics
Characterization of substrate/thin-film interfaces with x-ray microdiffraction
- I.C. Noyan
- J.L. Jordan-Sweet
- et al.
- 1998
- Applied Physics Letters
Electromigration-induced stress in aluminum conductor lines measured by x-ray microdiffraction
- P.-C. Wang
- G.S. Cargill
- et al.
- 1998
- Applied Physics Letters
Effect of the specimen size in predicting the mechanical properties of PbSn solder alloys
- N.R. Bonda
- I.C. Noyan
- 1996
- IEEE Transactions on Components Packaging and Manufacturing Technology Part A
Variation of the effective elastic constants in the sample coordinate system with tilt angle (ψ) for X-ray strain-stress analysis
- Yongchu Song
- I.C. Noyan
- 1996
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
The relationship between the golden section <z> and the elastic constants of ensembles selected by diffraction methods
- Conal E. Murray
- I.C. Noyan
- 1996
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Quantitative measurement of the stress transfer function in nickel/polyimide thin film/copper thin film structures
- L.S. Schadler
- I.C. Noyan
- 1995
- Applied Physics Letters
Residual Stress/Strain Analysis in Thin Films by X-ray Diffraction
- B.R. York
- 1995
- Critical Reviews in Solid State and Materials Sciences