Mechanisms for microstructure evolution in electroplated copper thin films
- J.M.E. Harper
- C. Cabral Jr.
- et al.
- 1999
- MRS Spring Meeting 1999
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66 results for I.C. Noyan
Mechanisms for microstructure evolution in electroplated copper thin films
- J.M.E. Harper
- C. Cabral Jr.
- et al.
- 1999
- MRS Spring Meeting 1999
Local and global stress distributions in BEOL metallization
- I.C. Noyan
- E. Liniger
- et al.
- 1996
- MRS Spring Meeting 1996
Determination of the mechanical response of thin films with x-rays
- I.C. Noyan
- G. Sheikh
- 1993
- MRS Spring Meeting 1993
Fourier analysis of X-ray microdiffraction profiles to characterize laser shock peened metals
- Hongqiang Chen
- Y. Lawrence Yao
- et al.
- 2004
- NAMRC 2004
Measurement volume considerations in X-ray microdiffraction stress analysis
- I.C. Noyan
- S. Kaldor
- 2004
- Powder Diffraction
Probing strain fields about thin film structures using x-ray microdiffraction
- C.E. Murray
- I.C. Noyan
- et al.
- 2003
- MRS Proceedings 2003
Evolution of strain energy during recrystallization of plated Cu films
- Conal E. Murray
- Mikhail Treger
- et al.
- 2016
- IEEE T-DMR
Numerical simulation of the X-ray stress analysis technique in polycrystalline materials under elastic loading
- D. Chidambarrao
- Y.C. Song
- et al.
- 1997
- Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science
Prediction of recrystallization times in electroplated copper thin films
- Mikhail Treger
- C. Witt
- et al.
- 2016
- Thin Solid Films