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182 results for Eduard Cartier

Surface potential and morphology issues of annealed (HfO ₂) _x(SiO ₂) _1-x gate oxides
- - R. Ludeke
  - P. Lysaght
  - et al.
- 2004
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Dual work function metal gate CMOS using CVD metal electrodes
- - V. Narayanan
  - A.C. Callegari
  - et al.
- 2004
- VLSI Technology 2004
Charge trapping in SiO₂/HfO₂ gate dielectrics: Comparison between charge-pumping and pulsed I_D-V_G
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- INFOS 2003
Direct Measurement of the Inversion Charge in MOSFETs: Application to Mobility Extraction in Alternative Gate Dielectrics
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- VLSI Technology 2003
Characterization of the V_T-instability in SiO₂ / HfO₂ gate dielectrics
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- IRPS 2003
Characterization of the V_T-instability in SIO₂/HFO₂ gate dielectrics
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- IRPS 2003
Imaging of oxide and interface charges in SiO₂-Si
- - R. Ludeke
  - E. Cartier
- 2001
- Microelectronic Engineering
Ultrathin high-K metal oxides on silicon: Processing, characterization and integration issues
- - E. Gusev
  - E. Cartier
  - et al.
- 2001
- Microelectronic Engineering
Breakdown measurements of ultra-thin SiO₂ at low voltage
- - J.H. Stathis
  - A. Vayshenker
  - et al.
- 2000
- VLSI Technology 2000
Hot electron emission lithography
- - M. Poppeller
  - E. Cartier
  - et al.
- 1999
- Microlithography 1999