A simulation study of oxygen vacancy-induced variability in HfO 2/metal gated SOI FinFET
- Amit Ranjan Trivedi
- Takashi Ando
- et al.
- 2014
- IEEE T-ED
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22 results for Emrah Acar
Hardware-corroborated variability-aware SRAM methodology
- Rajiv Joshi
- Rouwaida Kanj
- et al.
- 2013
- VLSID 2013
Spatial variation decomposition via sparse regression
- Wangyang Zhang
- Karthik Balakrishnan
- et al.
- 2012
- ICICDT 2012
DRC-free high density layout exploration with layout morphing and patterning quality assessment, with application to SRAM
- Amith Singhee
- Emrah Acar
- et al.
- 2012
- ISQED 2012
Virtual probe: A statistical framework for low-cost silicon characterization of nanoscale integrated circuits
- Wangyang Zhang
- Xin Li
- et al.
- 2011
- IEEE TCADIS
Electrical monitoring of gate and active area mask misalignment error
- Aditya Bansal
- Amith Singhee
- et al.
- 2011
- VLSI Circuits 2011
Abstraction and microarchitecture scaling in early-stage power modeling
- Hans Jacobson
- Alper Buyuktosunoglu
- et al.
- 2011
- HPCA 2011
Yield estimation of SRAM circuits using "Virtual SRAM Fab"
- Aditya Bansal
- Rama N. Singh
- et al.
- 2009
- ICCAD 2009
Performance modeling for early analysis of multi-core systems
- Reinaldo Bergamaschi
- Indira Nair
- et al.
- 2007
- CODES+ISSS 2007
Simulation of SOI transistor circuits through Non-Equilibrium Initial Condition Analysis (NEICA)
- Emrah Acar
- Peter Feldmann
- 2006
- ISCAS 2006