Measurement of VLSI Power Supply Current by Electron-Beam Probing
- Keith A. Jenkins
- Robert L. Franch
- 1992
- IEEE Journal of Solid-State Circuits
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30 results for Robert Franch
A Large VDSData Retention Test Pattern for DRAM’s
- R.L. Franch
- S. Dhong
- et al.
- 1992
- IEEE Journal of Solid-State Circuits
A 2-ns Cycle, 3.8-ns Access 512-kb CMOS ECL SRAM with a Fully Pipelined Architecture
- Terry I. Chappell
- Barbara A. Chappell
- et al.
- 1991
- IEEE Journal of Solid-State Circuits
A 4-Mb Low-Temperature DRAM
- Rick L. Mohler
- Christopher W. Long
- et al.
- 1991
- IEEE Journal of Solid-State Circuits
A 3.5-ns/77 K and 6.2-ns/300 K 64K CMOS RAM with ECL Interfaces
- Terry I. Chappell
- Stanley E. Schuster
- et al.
- 1989
- IEEE Journal of Solid-State Circuits
A 12-ns Low-Temperature DRAM
- Walter H. Henkels
- Nicky C. C. Lu
- et al.
- 1989
- IEEE T-ED
A 22-ns 1-Mbit CMOS High-Speed DRAM with Address Multiplexing
- Nicky C.C. Lu
- Gary B. Bronner
- et al.
- 1989
- IEEE Journal of Solid-State Circuits
A 20-ns 128-Kbit X 4 High-Speed DRAM with 330-Mbit/s Data Rate
- Nicky C.C. Lu
- Hu H. Chao
- et al.
- 1988
- IEEE Journal of Solid-State Circuits
Fast CMOS ECL Receivers with 100-mV Worst-Case Sensitivity
- Barbara A. Chappell
- Terry I. Chappell
- et al.
- 1988
- IEEE Journal of Solid-State Circuits
Micro/370: A 32-bit Single-Chip Microprocessor
- Hu H. Chao
- Feng-Hsien W. Shih
- et al.
- 1986
- IEEE Journal of Solid-State Circuits