Asymmetric Energy Distribution of Interface Traps in n- and p-MOSFETs with HfO2 Gate Dielectric on Ultrathin SiON Buffer Layer
- J.-P. Han
- E.M. Vogel
- et al.
- 2004
- IEEE Electron Device Letters
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Reliability monitoring for highly leaky devices
- J.T. Ryan
- J.P. Campbell
- et al.
- 2013
- IRPS 2013
Reverse short channel effects in high-k gated nMOSFETs
- J.-P. Han
- S.M. Koo
- et al.
- 2005
- Microelectronics Reliability
Energy Distribution of Interface Traps in High-K Gated MOSFETs
- J.-P. Han
- E.M. Vogel
- et al.
- 2003
- VLSI Technology 2003