A hardened field insulator
- G.J. Hu
- J.M. Aitken
- et al.
- 1981
- IEEE TNS
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27 results for John Aitken
Annealing of radiation-induced positive charge in MOS devices with aluminum and polysilicon gate contacts
- J.M. Aitken
- 1980
- Journal of Electronic Materials
Radiation-induced trapping centers in thin silicon dioxide films
- J.M. Aitken
- 1980
- Journal of Non-Crystalline Solids
1 μm MOSFET VLSI Technology: Part VIIII—Radiation Effects
- John M. Aitken
- 1979
- IEEE T-ED
Use of photocurrent-voltage characteristics of MOS structures to determine insulator bulk trapped charge densities and centroids
- D.J. DiMaria
- Z.A. Weinberg
- et al.
- 1977
- Journal of Electronic Materials
Avalanche injection of holes into SiO2
- J.M. Aitken
- D.R. Young
- 1977
- IEEE TNS
Electron injection studies of radiation induced positive charge in MOS devices
- J.M. Aitken
- D.J. DiMaria
- et al.
- 1976
- IEEE TNS