Statistical measurement of random telegraph noise and its impact in scaled-down high-κ/metal-gate MOSFETs
- H. Miki
- N. Tega
- et al.
- 2012
- IEDM 2012
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4 results for M. Yamaoka
Evaluation methodology for random telegraph noise effects in SRAM arrays
- M. Yamaoka
- Hiroshi Miki
- et al.
- 2011
- IEDM 2011
Voltage and temperature dependence of random telegraph noise in highly scaled HKMG ETSOI nFETs and its impact on logic delay uncertainty
- H. Miki
- M. Yamaoka
- et al.
- 2012
- VLSI Technology 2012
Understanding short-term BTI behavior through comprehensive observation of gate-voltage dependence of RTN in highly scaled high-κ / metal-gate pFETs
- Hiroshi Miki
- M. Yamaoka
- et al.
- 2011
- VLSI Technology 2011