Statistical measurement of random telegraph noise and its impact in scaled-down high-κ/metal-gate MOSFETs
- H. Miki
- N. Tega
- et al.
- 2012
- IEDM 2012
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Evaluation methodology for random telegraph noise effects in SRAM arrays
- M. Yamaoka
- Hiroshi Miki
- et al.
- 2011
- IEDM 2011