Modeling single-event upsets in 65-nm silicon-on-insulator semiconductor devices
- A.J. KleinOsowski
- Phil Oldiges
- et al.
- 2006
- IEEE TNS
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Modeling of variation in submicrometer CMOS ULSI technologies
- Scott K. Springer
- Sungjae Lee
- et al.
- 2006
- IEEE Transactions on Electron Devices